Vol. 7, Issue 4 (2019)
Evaluation of wheat genotypes for resistance against spot blotch disease
Author(s): Sandeep Kumar, SP Singh, Shivam Singh, Vikas Upadhyay, Dibya, Ankur Katiyar, Jay Kumar Yadav and Arun Kumar Jaiswal
Abstract: Spot blotch caused by Bipolaris sorokiniana (Sacc.) Shoem is one of the most important wheat leaf disease all over world; it appears in almost all wheat growing areas and causes severe yield loss every year. A field study was conducted during Rabi, 2017-18 and 2018-19 crop seasons at Main Experiment Station, NDUA and T, Kumarganj, Ayodhya to test the resistance of 209 genotypes against Bipolaris sorokiniana under artificial epiphytotics conditions. Each genotype was sown in last week of November in single row of one meter length. Variety Raj 4015 was used as check and was sown after every 20 genotypes. Pure culture of pathogen was inoculated on genotypes by using cleaned sprayer, at evening. Disease data was recorded using double digit scale based on per cent blighted area on flag leaf and one leaf just below. Out of 209 genotypes, five namely NEIR-109, NEIR-110, NEIR- 111, NEIR-113 and HS-645 genotypes were found resistant, 117 were moderately resistant, 68 were moderately susceptible and 19 were found susceptible against spot blotch disease of wheat.
Pages: 358-360 | 376 Views 56 Downloads
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How to cite this article:
Sandeep Kumar, SP Singh, Shivam Singh, Vikas Upadhyay, Dibya, Ankur Katiyar, Jay Kumar Yadav, Arun Kumar Jaiswal. Evaluation of wheat genotypes for resistance against spot blotch disease. Int J Chem Stud 2019;7(4):358-360.
